prof. RNDr. Ivan Ohlídal, DrSc.

2002

• Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method

  KLAPETEK Petr OHLÍDAL Ivan FRANTA Daniel POKORNÝ Pavel

  Article in Periodical

  Surface and Interface Analysis, year: 2002, volume: 34, edition: 1

• Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků

  ŠILER Martin KLAPETEK Petr OHLÍDAL Ivan

  Article in Periodical

  Jemná mechanika a optika, year: 2002, volume: 47, edition: 6-7

• Applications of atomic force microscopy for thin film boundary measurements

  KLAPETEK Petr OHLÍDAL Ivan FRANTA Daniel

  Article in Periodical

  Jemná mechanika a optika, year: 2002, volume: 47, edition: 6-7

• Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr POKORNÝ Pavel

  Article in Periodical

  Surface and Interface Analysis, year: 2002, volume: 34, edition: 1

• Influence of overlayers on determination of the optical constants of ZnSe thin films

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Article in Periodical

  Journal of Applied Physics, year: 2002, volume: 92, edition: 4

• Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry

  FRANTA Daniel ZAJÍČKOVÁ Lenka OHLÍDAL Ivan JANČA Jan VELTRUSKÁ Kateřina

  Article in Periodical

  Diamond and Related Materials, year: 2002, volume: 11, edition: 1

• Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method

  OHLÍDAL Miloslav OHLÍDAL Ivan FRANTA Daniel KRÁLÍK Tomáš JÁKL Miloš ELIÁŠ Marek

  Article in Periodical

  Surface and Interface Analysis, year: 2002, volume: 34, edition: 1

2001

• Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr POKORNÝ Pavel OHLÍDAL Miloslav

  Article in Periodical

  Surface and Interface Analysis, year: 2001, volume: 32, edition: 1

• Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation

  FRANTA Daniel OHLÍDAL Ivan

  Article in Proceedings

  12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 2001

• Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

  OHLÍDAL Ivan FRANTA Daniel FRUMAR Miroslav JEDELSKÝ Jaroslav NAVRÁTIL Karel

  Article in Periodical

  Journal of Optoelectronics and Advanced Materials, year: 2001, volume: 3, edition: 4